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 74LVQ125 Low Voltage Quad Buffer with 3-STATE Outputs
February 1992 Revised June 2001
74LVQ125 Low Voltage Quad Buffer with 3-STATE Outputs
General Description
The LVQ125 contains four independent non-inverting buffers with 3-STATE outputs.
Features
s Ideal for low power/low noise 3.3V applications s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Guaranteed incident wave switching into 75
Ordering Code:
Order Number 74LVQ125SC 74LVQ125SJ Package Number M14A M14D Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Device also available in Tape and Reel. Specify by appending suffix letter "X" to the ordering code.
Logic Symbol
IEEE/IEC
Connection Diagram
Pin Descriptions
Pin Names An , Bn On Description Inputs Outputs
Truth Table
Inputs An L L H
H = HIGH Voltage Level L = LOW Voltage Level Z = HIGH Impedance X = Immaterial
Output Bn L H X On L H Z
(c) 2001 Fairchild Semiconductor Corporation
DS011349
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74LVQ125
Absolute Maximum Ratings(Note 1)
Supply Voltage (VCC ) DC Input Diode Current (IIK) VI = -0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = -0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current
-0.5V to +7.0V -20 mA +20 mA -0.5V to VCC + 0.5V -20 mA +20 mA -0.5V to VCC + 0.5V 50 mA 200 mA -65C to +150C 100 mA
Recommended Operating Conditions (Note 2)
Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate (V/t) VIN from 0.8V to 2.0V VCC @ 3.0V 125 mV/ns 2.0V to 3.6V 0V to VCC 0V to VCC
-40C to +85C
Note 1: The "Absolute Maximum Ratings" are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The "Recommended Operating Conditions" table will define the conditions for actual device operation. Note 2: Unused inputs must be held HIGH or LOW. They may not float.
DC Electrical Characteristics
Symbol VIH VIL VOH Parameter Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage VOL Maximum Low Level Output Voltage IIN IOZ Maximum Input Leakage Current Maximum 3-STATE Leakage Current IOLD IOHD ICC VOLP VOLV VIHD VILD Minimum Dynamic (Note 4) Output Current Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Maximum High Level Dynamic Input Voltage Maximum Low Level Dynamic Input Voltage 3.6 3.6 3.6 3.6 3.3 3.3 3.3 3.3 0.6 -0.6 1.7 1.5 4.0 1.0 -1.0 2.0 0.8 0.25 2.5 36 -25 40.0 A mA mA A V V V V VCC (V) 3.0 3.0 3.0 3.0 3.0 3.0 3.6 0.002 TA = +25C Typ 1.5 1.5 2.99 2.0 0.8 2.9 2.58 0.1 0.36 0.1 TA = -40C to +85 C Guaranteed Limits 2.0 0.8 2.9 2.48 0.1 0.44 1.0 V V V V V V A VOUT = 0.1V or VCC - 0.1V VOUT = 0.1V or VCC - 0.1V IOUT = -50 A VIN = VIL or VIH (Note 3) IOH = -12 mA IOUT = 50 A VIN = VIL or VIH (Note 3) IOL = 12 mA VI = VCC, GND VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND VOLD = 0.8V Min (Note 5) VOHD = 2.0V Min (Note 5) VIN = VCC or GND (Note 6)(Note 7) Units Conditions
(Note 6)(Note 7) (Note 6)(Note 8) (Note 6)(Note 8)
Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75 for commercial temperature range is guaranteed for 74LVQ. Note 6: Worst case package. Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND. Note 8: Max number of Data Inputs (n) switching. (n - 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
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2
74LVQ125
AC Electrical Characteristics
TA = +25C Symbol Parameter VCC (V) tPLH tPHL tPZH tPZL tPHZ tPLZ tOSHL, tOSLH Propagation Delay Data to Output Propagation Delay Data to Output Output Enable Time Output Enable Time Output Disable Time Output Disable Time Output to Output Skew (Note 9) Data to Output 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 Min 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 CL = 50 pF Typ 7.8 6.5 7.8 6.5 7.2 6.0 9.0 7.5 9.0 7.5 9.0 7.5 1.0 1.0 Max 12.7 9.0 12.7 9.0 14.8 10.5 14.0 10.0 14.0 10.0 14.8 10.5 1.5 1.5 TA = -40C to +85C CL = 50 pF Min 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 Max 14.0 10.0 14.0 10.0 16.0 11.0 16.0 11.0 15.0 10.5 16.5 11.5 1.5 1.5 ns ns ns ns ns ns ns Units
Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.
Capacitance
Symbol CIN CPD (Note 10) Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 34 Units pF pF VCC = Open VCC = 3.3V Conditions
Note 10: CPD is measured at 10 MHz.
3
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74LVQ125
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M14A
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4
74LVQ125 Low Voltage Quad Buffer with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 5 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com
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